Single Beam UV VIS Spectrophotometer

Single Beam UV VIS SpectrophotometerTRSUV-601

Photometry : Split Beam
Monochromatic Type : Czerny-Turner
Focal Length : 160 mm
Grating : 1200 lines/mm
Detector : Silicon Photocell
Spectrum Bandwidth : 2 nm
Wavelength Range : 190 to 1100 nm
Wavelength Accuracy : ± 0.5 nm
Wavelength Repeatability : ≤ 0.2 nm
Photometric Range : 0.0 to 200.0% T -0.301 to 4.000A 0.000 to 9999C
Photometric Accuracy : ± 0.3% T ± 0.002Abs (0 to 0.5A) ± 0.004Abs (0.5 to 1A)
Photometric Repeatability : ≤ 0.15% T 0.001Abs (0 to 0.5A) 0.002Abs (0.5 to 1A)
Wavelength Scanning Speed : Fast, medium, slow
Baseline Flatness : ≤ ± 0.002 A
Stray Light : ≤ 0.03% (measured by NaI at 220 nm) (measured at NaNO2 at 360 nm)
Noise : 100%(T) noise ≤ 0.15% (T), 0% (T) noise ≤ 0.1% (T)
Baseline Drift : ± 0.0009 Abs / h (250 nm and 500 nm after preheat warm up for 2 hours )
Power : AC 220 V± 22 V, 50 Hz± 1 Hz, 200 W
COM Port : USB
Packing Size : 740 mm×630 mm×450 mm
Weight : 0.21m³, 35kg

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Photometry : Split Beam
Monochromatic Type : Czerny-Turner
Focal Length : 160 mm
Grating : 1200 lines/mm
Detector : Silicon Photocell
Spectrum Bandwidth : 2 nm
Wavelength Range : 190 to 1100 nm
Wavelength Accuracy : ± 0.5 nm
Wavelength Repeatability : ≤ 0.2 nm
Photometric Range : 0.0 to 200.0% T -0.301 to 4.000A 0.000 to 9999C
Photometric Accuracy : ± 0.3% T ± 0.002Abs (0 to 0.5A) ± 0.004Abs (0.5 to 1A)
Photometric Repeatability : ≤ 0.15% T 0.001Abs (0 to 0.5A) 0.002Abs (0.5 to 1A)
Wavelength Scanning Speed : -
Baseline Flatness : -
Stray Light : ≤ 0.05% (measured by NaI at 220 nm) (measured at NaNO2 at 360 nm)
Noise : 100%(T) noise ≤ 0.15% (T), 0% (T) noise ≤ 0.1% (T)
Baseline Drift : ± 0.0009 Abs / h (250 nm and 500 nm after preheat warm up for 2 hours )
Power : AC 220 V± 22 V, 50 Hz± 1 Hz, 200 W
COM Port : USB
Packing Size : 740 mm×630 mm×450 mm
Weight : 0.21m³, 35kg

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$23.34

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Compare

$23.34

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Compare

$23.34

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Photometry : Single Beam
Monochromatic Type : Czerny-Turner
Focal Length : 160 mm
Grating : 1200 lines/mm
Detector : Silicon Photocell
Spectrum Bandwidth : 2nm
Wavelength Range : 190 to 1100 nm
Wavelength Accuracy : ± 1 nm
Wavelength Repeatability : ≤ 0.5 nm
Photometric Range : 0.0 to 200.0% T, -0.301 to 4.000A, 0.000 to 9999C
Photometric Accuracy : ± 0.3% T, ± 0.002Abs (0 to 0.5 A) ± 0.004Abs (0.5 to 1 A)
Photometric Repeatability : ≤ 0.15% T, 0.001Abs (0 to 0.5 A) 0.002Abs (0.5 to 1 A)
Wavelength Scanning Speed : Fast, medium, slow
Baseline Flatness : ≤ ± 0.003 A(200 to 1090 nm)
Stray Light : ≤ 0.1% ( at 220 nm NaI ; at 360 nm NaNO2)
Noise : 100%(T) noise ≤ 0.5% (T), 0% (T) noise ≤ 0.2% (T)
Baseline Drift : ± 0.002 Abs / 30 mins (250 nm and 500 nm after preheating warm-up for 2 hours )
Power : AC220 V ± 22 V, 50Hz ± 1Hz, 180 W
Packing Size : 630 mm×610 mm×500 mm
Weight : 0.16m³, 25 Kg

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$23.34

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Photometry : Single Beam
Monochromatic Type : Czerny-Turner
Focal Length : 160 mm
Grating : 1200 lines/mm
Detector : Silicon Photocell
Spectrum Bandwidth : 2nm
Wavelength Range : 190 to 1100 nm
Wavelength Accuracy : ± 1 nm
Wavelength Repeatability : ≤ 0.5 nm
Photometric Range : 0.0 to 200.0% T, -0.301 to 4.000A, 0.000 to 9999C
Photometric Accuracy : ± 0.3% T, ± 0.002Abs (0 to 0.5 A) ± 0.004Abs (0.5 to 1 A)
Photometric Repeatability : ≤ 0.15% T, 0.001Abs (0 to 0.5 A) 0.002Abs (0.5 to 1 A)
Wavelength Scanning Speed : -
Baseline Flatness : -
Stray Light : ≤ 0.1% ( at 220 nm NaI ; at 360 nm NaNO2)
Noise : 100%(T) noise ≤ 0.5% (T), 0% (T) noise ≤ 0.2% (T)
Baseline Drift : ± 0.002 Abs / 30 mins (250 nm and 500 nm after preheating warm-up for 2 hours )
Power : AC220 V ± 22 V, 50Hz ± 1Hz, 180 W
Packing Size : 630 mm×610 mm×500 mm
Weight : 0.16m³, 25 Kg

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$23.34

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Photometry : Single Beam
Monochromatic Type : Czerny-Turner
Focal Length : 160 mm
Grating : 1200 lines/mm
Detector : Silicon Photocell
Spectrum Bandwidth : 4 nm
Wavelength Range : 325 to 1100 nm
Wavelength Accuracy : ± 1 nm
Wavelength Repeatability : ≤ 0.5 nm
Photometric Range : 0.0 to 200.0 % T
-0.301 to 4.000 A
0.000 to 9999 C
Photometric Accuracy : ± 0.3% T, ± 0.002Abs (0 to 0.5 A)
± 0.004Abs (0.5 to 1 A)
Photometric Repeatability : ≤ 0.15% T, 0.001Abs (0 to 0.5 A)
0.002Abs (0.5 to 1 A)
Wavelength Scanning Speed : Fast, medium, slow
Baseline Flatness : ≤ ± 0.003 A(335 to 1090 nm)
Stray Light : ≤ 0.1% T(measured at NaNO2 at 360 nm)
Noise : 100%(T) noise ≤ 0.5% (T), 0% (T) noise ≤ 0.2% (T)
Baseline Drift : ± 0.002 Abs / 30 mins ( 500nm after preheat warm up for 2 hours )
Power : AC220 V ± 22 V, 50Hz ± 1Hz, 100 W
Packing Size : 630 mm×610 mm×500 mm
Weight : 0.16m³, 25 Kg

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$23.34

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Photometry : Single Beam
Monochromatic Type : Czerny-Turner
Focal Length : 160 mm
Grating : 1200 lines/mm
Detector : Silicon Photocell
Spectrum Bandwidth : 4 nm
Wavelength Range : 325 to 1100 nm
Wavelength Accuracy : ± 1 nm
Wavelength Repeatability : ≤ 0.5 nm
Photometric Range : 0.0 to 200.0 % T -0.301 to 4.000 A 0.000 to 9999 C
Photometric Accuracy : ± 0.3% T, ± 0.002Abs (0 to 0.5 A)
± 0.004Abs (0.5 to 1 A)
Photometric Repeatability : ≤ 0.15% T, 0.001Abs (0 to 0.5 A)
0.002Abs (0.5 to 1 A)
Wavelength Scanning Speed : -
Baseline Flatness : -
Stray Light : ≤ 0.1% T(measured at NaNO2 at 360 nm)
Noise : 100%(T) noise ≤ 0.5% (T), 0% (T) noise ≤ 0.2% (T)
Baseline Drift : ± 0.002 Abs / 30 mins ( 500nm after preheat warm up for 2 hours )
Power : AC220 V ± 22 V, 50Hz ± 1Hz, 100 W
Packing Size : 630 mm×610 mm×500 mm
Weight : 0.16m³, 25 Kg

Compare

$23.34

Cart Catalog